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Bardin, Andrey A.; Haymaker, Alison; Banihashemi, Fateme; Lin, Jerry Y.S.; Martynowycz, Michael W.; Nannenga, Brent L. (, Ultramicroscopy)We report new advancements in the determination and high-resolution structural analysis of beam-sensitive metal organic frameworks (MOFs) using microcrystal electron diffraction (MicroED) coupled with focused ion beam milling at cryogenic temperatures (cryo-FIB). A microcrystal of the beam-sensitive MOF, ZIF-8, was ion-beam milled in a thin lamella approximately 150 nm thick. MicroED data were collected from this thin lamella using an energy filter and a direct electron detector operating in counting mode. Using this approach, we achieved a greatly improved resolution of 0.59 Å with a minimal total exposure of only 0.64 e−/A2. These innovations not only improve model statistics but also further demonstrate that ion-beam milling is compatible with beam-sensitive materials, augmenting the capabilities of electron diffraction in MOF research.more » « less
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Murali, Dheeraj R.L.; Banihashemi, Fateme; Lin, Jerry Y.S. (, Journal of Membrane Science)
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Banihashemi, Fateme; Lin, Jerry Y. (, Industrial & Engineering Chemistry Research)
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Banihashemi, Fateme; Bu, Guanhong; Thaker, Amar; Williams, Dewight; Lin, Jerry Y.S.; Nannenga, Brent L. (, Ultramicroscopy)null (Ed.)
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